Surface planarization and masked ion-beam structuring of YBa<sub>2</sub>Cu<sub>3</sub>O<sub>7</sub> thin films

Author(s)
Johannes D. Pedarnig, Khurram Siraj, Marius Bodea, Ionut Puica, Wolfgang Lang, R. Kolarova, Peter Bauer, Klaus Haselgrübler, Christine Hasenfuss, Igor Beinik, Christian Teichert
Abstract

Surface planarization and masked ion-beam structuring (MIBS) of high-Tc superconducting (HTS) YBa2Cu3O7-δ (YBCO) thin films grown by pulsed-laser deposition (PLD) method is reported. Chemical-mechanical polishing, plasma etching, and oxygen annealing of YBCO films strongly reduce the particulate density (~ 10-2 x) and surface roughness (~ 10-1 x) of as-grown PLD layers. The resistivity, critical temperature T-c approximate to 90 K and critical current density Jc (77 K)> 1 MA/cm2 of films are not deteriorated by the planarization procedure. The YBCO films are modified and patterned by irradiation with He ions of 75 key energy. Superconducting tracks patterned by MIBS without removal of HIS material and, for comparison, by wet-chemical etching show same Tc and Jc(T) values. Different micro- and nano-patterns are produced in parallel on planarized films. The size of irradiated pattern depends on the mask employed for beam shaping and features smaller than 70 nm are achieved.

Organisation(s)
Electronic Properties of Materials
External organisation(s)
Johannes Kepler Universität Linz, Montanuniversität Leoben
Journal
Thin Solid Films
Volume
518
Pages
7075-7080
No. of pages
6
ISSN
0040-6090
DOI
https://doi.org/10.1016/j.tsf.2010.07.021
Publication date
2010
Peer reviewed
Yes
Austrian Fields of Science 2012
1030 Physics, Astronomy
Portal url
https://ucrisportal.univie.ac.at/en/publications/9367dd5e-6cb9-4e62-be89-77f1c294de14