Incidence of multilayers in chemically exfoliated graphene
- Author(s)
- P. Szirmai, B. G. Márkus, J. C. Chacón-Torres, P. Eckerlein, K. Edelthalhammer, J. M. Englert, U. Mundloch, A. Hirsch, F. Hauke, B. Náfrádi, L. Forró, C. Kramberger, T. Pichler, F. Simon
- Abstract
An efficient route to synthesize macroscopic amounts of graphene is highly desired and a bulk characterization of such samples, in terms of the number of layers, is equally important. We present a Raman spectroscopy-based method to determine the distribution of the number of graphene layers in chemically exfoliated graphene. We utilize a controlled vapor-phase potassium intercalation technique and identify a lightly doped stage, where the Raman modes of undoped and doped few-layer graphene flakes coexist. The spectra can be unambiguously distinguished from alkali doped graphite, and a modeling with the distribution of the layers yields an upper limit of flake thickness of five layers with a significant single-layer graphene content. Complementary statistical AFM measurements on individual few-layer graphene flakes find a consistent distribution of the layer numbers.
- Organisation(s)
- Electronic Properties of Materials
- External organisation(s)
- Budapest University of Technology and Economics
- Publication date
- 07-2018
- Austrian Fields of Science 2012
- 103018 Materials physics, 103020 Surface physics, 103009 Solid state physics
- Keywords
- Portal url
- https://ucrisportal.univie.ac.at/en/publications/48946867-b11d-45ff-a172-a3cb192d85c0