Atom-by-atom STEM investigation of defect engineering in graphene
- Author(s)
- Q. M. Ramasse, D. M. Kepapstoglou, F. S. Hage, T. Susi, J. Kotakoski, C. Mangler, P. Ayala, J. Meyer, J. A. Hinks, S. Donnelly, R. Zan, C. T. Pan, S. J. Haigh, U. Bangert
- Organisation(s)
- Electronic Properties of Materials, Physics of Nanostructured Materials
- External organisation(s)
- SuperSTEM Laboratory, University of Helsinki, University of Huddersfield, University of Limerick, University of Manchester
- Journal
- Microscopy and Microanalysis
- Volume
- 20
- Pages
- 1736-1737
- No. of pages
- 2
- ISSN
- 1431-9276
- DOI
- https://doi.org/10.1017/S1431927614010411
- Publication date
- 08-2014
- Peer reviewed
- Yes
- Austrian Fields of Science 2012
- 103042 Electron microscopy, 103009 Solid state physics, 103018 Materials physics
- ASJC Scopus subject areas
- Instrumentation
- Portal url
- https://ucrisportal.univie.ac.at/en/publications/17d8471b-17cb-4f0b-9aea-33e1d30fe3af