Imaging the transmission of light through a crystalline silicon wafer with a silicon detector array

Author(s)
Viktor Schlosser
Abstract

A simple experimental set up for capturing the distribution of light transmitted through a silicon wafer is presented. As sensing element a silicon based charge coupled device, CCD of a 4 Megapixel camera was used. The responsitivity of the camera in the optical NIR wavelength range was evaluated. The applicability of a pulsed Xenon arc lamp built into a photographer's flash light as light source was investigated. First results from transmission images proof the potential of these two components for further applications in the solar industry.

Organisation(s)
Electronic Properties of Materials
Pages
8085-8089
No. of pages
5
DOI
https://doi.org/10.1109/IECON.2013.6700485
Publication date
2013
Publication status
Published
Austrian Fields of Science 2012
1030 Physics, Astronomy, 103018 Materials physics
Keywords
silicon wafer, NIR transmission, imaging, STRESSES
Portal url
https://ucris.univie.ac.at/portal/en/publications/imaging-the-transmission-of-light-through-a-crystalline-silicon-wafer-with-a-silicon-detector-array(cec7c1fd-9c39-492c-9b0f-2cd2fd4bc0a2).html