Magnetoplasma-reflection of thin films of YBa<sub>2</sub>Cu<sub>3</sub>O<sub>7</sub>

W. Markowitsch, Wolfgang Lang, H. Jodlbauer, P. Schwab, X.Z. Wang, D. Bäuerle

Reflection and magnetoreflection measurements on thin films of Y-Ba-Cu-O are reported. The reflection spectra show an edge in the near infrared. This feature is interpreted as a plasma edge. Magnetoreflection measurements were carried out in Faraday-configuration using a He-Ne-laser with a wavelength of 1.15 μm (1.07 eV), i.e. in the region of the plasma edge. A change of the reflectance of circular polarized light was observed as a function of the external magnetic field. We interprete this effect as a shift of the plasma edge induced by the magnetic field (magnetoplasma effect). From this shift we determine the value of the effective carrier mass meff = 4mo. This result indicates a strong coupling of the carriers to other excitations.

Electronic Properties of Materials
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Austrian Fields of Science 2012
Materials physics
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