Incidence of multilayers in chemically exfoliated graphene

Author(s)
P. Szirmai, B. G. Márkus, J. C. Chacón-Torres, P. Eckerlein, K. Edelthalhammer, J. M. Englert, U. Mundloch, A. Hirsch, F. Hauke, B. Náfrádi, L. Forró, C. Kramberger, T. Pichler, F. Simon
Abstract

An efficient route to synthesize macroscopic amounts of graphene is highly desired and a bulk characterization of such samples, in terms of the number of layers, is equally important. We present a Raman spectroscopy-based method to determine the distribution of the number of graphene layers in chemically exfoliated graphene. We utilize a controlled vapor-phase potassium intercalation technique and identify a lightly doped stage, where the Raman modes of undoped and doped few-layer graphene flakes coexist. The spectra can be unambiguously distinguished from alkali doped graphite, and a modeling with the distribution of the layers yields an upper limit of flake thickness of five layers with a significant single-layer graphene content. Complementary statistical AFM measurements on individual few-layer graphene flakes find a consistent distribution of the layer numbers.

Organisation(s)
Electronic Properties of Materials
Publication date
07-2018
Austrian Fields of Science 2012
103018 Materials physics, 103020 Surface physics, 103009 Solid state physics
Keywords
Portal url
https://ucris.univie.ac.at/portal/en/publications/incidence-of-multilayers-in-chemically-exfoliated-graphene(48946867-b11d-45ff-a172-a3cb192d85c0).html