Near-field infrared microscopy of nanometer-sized nickel clusters inside single-walled carbon nanotubes

Author(s)
Gergely Nemeth, Daniel Datz, Aron Pekker, Takeshi Saito, Oleg Domanov, Hidetsugu Shiozawa, Sandor Lenk, Bela Pecz, Pal Koppa, Katalin Kamaras
Abstract

Nickel nanoclusters grown inside single-walled carbon nanotubes (SWCNT) were studied by infrared scattering-type scanning near-field optical microscopy (s-SNOM). The metal clusters give high local contrast enhancement in near-field phase maps caused by the excitation of free charge carriers. The experimental results are supported by calculations using the finite dipole model, approximating the clusters with elliptical nanoparticles. Compared to magnetic force microscopy, s-SNOM appears much more sensitive to detect metal clusters inside carbon nanotubes. We estimate that these clusters contain fewer than approximate to 700 Ni atoms.

Organisation(s)
Electronic Properties of Materials
External organisation(s)
Hungarian Academy of Sciences, National Institute of Advanced Industrial Science and Technology (AIST), Czech Academy of Sciences, Budapest University of Technology and Economics
Journal
RSC Advances
Volume
9
Pages
34120-34124
No. of pages
5
ISSN
2046-2069
DOI
https://doi.org/10.1039/c9ra07089c
Publication date
10-2019
Peer reviewed
Yes
Austrian Fields of Science 2012
Physical chemistry, Materials physics
Keywords
Portal url
https://ucris.univie.ac.at/portal/en/publications/nearfield-infrared-microscopy-of-nanometersized-nickel-clusters-inside-singlewalled-carbon-nanotubes(2350e2e9-78b9-408a-a1c8-57887dae9064).html