Atom-by-atom STEM investigation of defect engineering in graphene

Author(s)
Q. M. Ramasse, D. M. Kepapstoglou, F. S. Hage, T. Susi, J. Kotakoski, C. Mangler, P. Ayala, J. Meyer, J. A. Hinks, S. Donnelly, R. Zan, C. T. Pan, S. J. Haigh, U. Bangert
Organisation(s)
Electronic Properties of Materials, Physics of Nanostructured Materials
External organisation(s)
SuperSTEM Laboratory, University of Helsinki, University of Huddersfield, University of Limerick, University of Manchester
Journal
Microscopy and Microanalysis
Volume
20
Pages
1736-1737
No. of pages
2
ISSN
1431-9276
DOI
https://doi.org/10.1017/S1431927614010411
Publication date
08-2014
Peer reviewed
Yes
Austrian Fields of Science 2012
103042 Electron microscopy, 103009 Solid state physics, 103018 Materials physics
ASJC Scopus subject areas
Instrumentation
Portal url
https://ucris.univie.ac.at/portal/en/publications/atombyatom-stem-investigation-of-defect-engineering-in-graphene(17d8471b-17cb-4f0b-9aea-33e1d30fe3af).html