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Magnetoplasma-reflection of thin films of YBa2Cu3O7

Authors/others:Markowitsch, W.Lang, WolfgangJodlbauer, H.Schwab, P.Wang, X.Z.Bäuerle, D.
Abstract:Reflection and magnetoreflection measurements on thin films of Y-Ba-Cu-O are reported. The reflection spectra show an edge in the near infrared. This feature is interpreted as a plasma edge. Magnetoreflection measurements were carried out in Faraday-configuration using a He-Ne-laser with a wavelength of 1.15 μm (1.07 eV), i.e. in the region of the plasma edge. A change of the reflectance of circular polarized light was observed as a function of the external magnetic field. We interprete this effect as a shift of the plasma edge induced by the magnetic field (magnetoplasma effect). From this shift we determine the value of the effective carrier mass meff = 4mo. This result indicates a strong coupling of the carriers to other excitations.
Number of pages:6
Date of publication:1992
Digital Object Identifier (DOI):http://dx.doi.org/10.1016/B978-0-444-89353-6.50035-X
Publication Type:Chapter
Host publication's title:High Tc Superconductor Thin Films
Host publication's editors:Correra, H.
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